Showing results: 16 - 30 of 144 items found.
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M9816AS -
Keysight Technologies
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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M9817AS -
Keysight Technologies
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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S94511B -
Keysight Technologies
The S94511B Nonlinear Component Characterization provides strong insight into the nonlinear behavior of your device under test (DUT).
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M9818AS -
Keysight Technologies
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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IQfact5G -
LitePoint Corporation
IQfact5G ensures quality device characterization and facilitates easy customization of test flow, thus significantly reducing engineering effort.
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DL10-ISO -
Teledyne LeCroy
The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
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DL07-ISO -
Teledyne LeCroy
The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
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DL03-ISO -
Teledyne LeCroy
The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
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S93300B -
Keysight Technologies
Configure a 170 GHz broadband vector network analyzer (VNA) for on-wafer device characterization of emerging 5G and 6G MMICs.
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S93301B -
Keysight Technologies
Configure a 220 GHz broadband vector network analyzer (VNA) for on-wafer device characterization of emerging 5G and 6G MMICs
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Modus Test, LLC
Instrumentation• 16,128 Kelvin ChannelsApplications• Cres Test Characterization For Test Sockets / Probe Heads / Connectors• Package Testing / Qualification• Device Opens / Shorts Testing• MTC Compatible For Integrated Cycling / Stepping / Force Measurement• MTC-TC Compatible For Hot/cold Thermal Chamber Characterization
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Dynamic Test Solutions
Engineer, Design, Fabricate & Assemble Custom Boards for:*Device Characterization and Verification*Bench Testing*Failure Analysis*General Laboratory Use
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M9815AS -
Keysight Technologies
The PXI vector component analyzer (VCA) enables complex multiport device characterization with continuous wave (CW) and modulated signal measurements.
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PVE300 -
HenergySolar
The PVE300 system is a monolithic,turnkey solution for photovoltaic material and device characterization;a key component in research, or as part of a production-line quality process.
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BV0012B -
Keysight Technologies
Easily control your dynamic electronic loads, build automated tests and visualize measurements over time for better device characterization.